Scanning Electron Microscope (SEM)
a microscope that uses a finely focused electron beam scanned across a sample to produce high resolution images. A SEM can resolve much smaller feature than a standard microscope, down to approximately 2 nanometers. | ||||
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Scanning Electron Microscope Definition from Encyclopedia Dictionaries & Glossaries
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Scanning electron microscope
The scanning electron microscope (SEM) is a type of electron microscope capable of producing high-resolution images of a sample surface. Due to the manner in which the image is created, SEM images have a characteristic three-dimensional appearance and are useful for judging the surface structure of the sample.
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